
SRC6001A Online Test System
- Self-learning and self-parameter-selecting
- Fast testing
- Modular configuration, easy upgrading
- 4-probes and 8-lines techniques, eliminating line and contact resistance
- Phase measurement, capable of parallel resistance-capacitance test
- Capable of testing multi-pins components
- As high as 8 probes isolation test
- Self diagnostics
- Bad probe contact alarming
- Auto data back up
- Capable of testing IC assembling errors, IC opening circuits
- Self-elimination of distribution capacitance and contact resistance
- List, table and graphic statistics functions
- High density test fixture, capable of SMT circuits with QFP, BGA, SOJ etc.
components
- Transistor β testing
- Testing of optoelectronics, potentiometers, connectors, crystals, resistors up to 0.1Ω, capacitors to 1pF, inductors to 1μH
- Waveform display
- Testing of regulators<60V
- Self-calibration
- Windows operating system
- Up to 5MHz output testing signals
- Testing frequency up to 50MHz
- Software filters
- CMOS testing circuits
- Relay matrix(option)
- Test data protection
Specifications:
- Test Points
- Standard: 320 points(default 5 modular circuit cards), Max. 2496 points
- 64 points/every modular card, expand in unit of modular card
- Open/Closed Circuit Test
- Mode: group scanning
- Programming: self-learning
- Test threshold: 5Ω-80Ω programmable
- Test current: ≤10mA
- Speed: 1024 points/S
- Components Test
- Test voltage: ±10V programmable(CMOS modular board -10V-+5V)
- Test current: 0.1μA-100mA programmable(CMOS modular board 0.1μA-20mA)
- Test speed: 10ms/step
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- Resistor test:
- Range: 0.1Ω-40MΩ
- Stimulation voltage: 0-5V programmable
- Stimulation current: 100nA-10mA
| Range |
Precison |
Speed |
| <1Ω |
10mΩ resolution |
1ms-5ms |
| 1Ω-400KΩ |
±(1%+1Ω) |
1ms-5ms |
| 400KΩ-2MΩ |
±2% |
1ms-20ms |
| 2MΩ-40MΩ |
±3% |
20ms-40ms |
- Capacitor test:
- Range: 1pF-40mF
- Stimulation voltage: 240mV-10V programmable
- Stimulation current: 100nA-10mA
| Range |
Precison |
Speed |
| 1pF-100pF |
±(5%+3pF) |
2ms-10ms |
| 100pF-1nF |
±(5%+10pF) |
2ms-10ms |
| 1nF-1uF |
±3% |
2ms-10ms |
| 1uF-500uF |
±5% |
2ms-10ms |
| 500uF-2000uF |
±5% |
5ms-10ms |
| 2000uF-40mF |
±5% |
10ms-15ms |
- Other tests:
| Test item |
Precison |
Precision |
| Voltage |
0V-10V, option: 0V-200V |
±0.1% |
| Inductance |
1μH-250H |
±5% |
| Jumper |
2.5V,1Ω-100Ω |
|
| PN conductance |
0.2V-2.5V |
|
| Diode |
PN curve, reversal characterization |
|
| Regulator |
≤48V |
|
| Frequency |
1Hz-50MHz |
±0.1% |
| CMOS transistor |
0.1V-2.5V |
|
| Transistor |
β 1-1000, ≤10mA driving current |
±5% |
| Optoelectronics |
1mV-10mV driving |
0.01V-2.5V |
| Other components |
Optoelectronics, MOSFET, potentiometers, replays,connectors, etc.
0-10mA,0-10V |
|
| Polarized capacitors |
0.1uF-40mF |
|
| IC opening |
PN scanning, voltage sensing |
|
| Others |
Freuqency, pulse width, logic, customerization |
|
- Self-Isolation test:
- Isolation mode: automatic/manual
- Isolation points: Max. 8 points/step
- Isolation current: 0-100mA; CMOS 10mA.
- Test fixtures(compressed air):
- Probe contacts self-checking, empty test board checking
- Max. PCB size: 500mm X 390mm
- Max. air compress: 3925N(0.5Mpa)
- System requirement:
- 1.0G or faster, 64M RAM, hard disk>20G, monitor>15" (800x600)
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